|
skos:definition |
MSH: Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.,CSP: microscopy in which the object is examined directly by an electron beam scanning the specimen point by point, giving the surface image a three dimensional quality.,NCI: An electron microscopy imaging technique that is utilized to examine structural components of a sample by passing electrons through a specimen that has been coated with a heavy metal.,NCI: Technique of electron microscopy in which the specimen is coated with heavy metal and th
|
