Linked Life Data

21042630

Source:http://linkedlifedata.com/resource/pubmed/id/21042630

Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
1
pubmed:dateCreated
2011-1-13
pubmed:abstractText
We introduce a simple Scanning Near-Field Ellipsometer Microscopy (SNEM) setup to address the rapidly increasing need for simple, routine optical imaging techniques with resolution well below the diffraction limit. Our setup is based on the combination of commercially available atomic force microscope (AFM) and ellipsometry equipment with gold-coated AFM tips to obtain near-field optical images with a demonstrated resolution below ?/10. AFM topographical data, obtained in contact mode, and near-field optical data were acquired simultaneously using a combined AFM-ellipsometer. The highly enhanced field due to lightning-rod effects and localized surface plasmons excited at the end of the gold-coated tip allowed us to resolve and identify metallic nanoparticles embedded in poly(methyl methacrylate) as well as microphases in microphase-separated block copolymer films.
pubmed:language
eng
pubmed:journal
pubmed:citationSubset
IM
pubmed:chemical
pubmed:status
MEDLINE
pubmed:month
Jan
pubmed:issn
2040-3372
pubmed:author
pubmed:issnType
Electronic
pubmed:volume
3
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
233-9
pubmed:dateRevised
2011-6-22
pubmed:meshHeading
pubmed:year
2011
pubmed:articleTitle
Scanning Near-Field Ellipsometry Microscopy: imaging nanomaterials with resolution below the diffraction limit.
pubmed:affiliation
University of Twente, MESA+ Institute for Nanotechnology and Faculty of Science and Technology, Department of Materials Science and Technology of Polymers, P.O. Box 217, 7500 AE, Enschede, The Netherlands.
pubmed:publicationType
Journal Article, Research Support, Non-U.S. Gov't