Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
4
pubmed:dateCreated
2010-3-9
pubmed:abstractText
Coherent diffractive imaging involves the inversion of a diffraction pattern to find the wave function at the exit-surface plane of the specimen. It is a promising technique for imaging, for example, nanoparticles with electrons and biological molecules with X-rays. If the illumination is not a plane wave of infinite extent, then a relative drift between the illumination and the object introduces errors into the diffraction pattern; an issue which is often overlooked. This may be of particular importance for applications with electron microscopes which use nanoscale probes. Here we show that beams which are uniform over a sufficiently large region can be used to pose a phase retrieval problem that is immune from specimen drift, provided suitable analysis of the diffraction data is undertaken. The method only applies to objects contained within a support that is smaller than a uniform region of the beam.
pubmed:language
eng
pubmed:journal
pubmed:status
PubMed-not-MEDLINE
pubmed:month
Mar
pubmed:issn
1879-2723
pubmed:author
pubmed:copyrightInfo
(c) 2010 Elsevier B.V. All rights reserved.
pubmed:issnType
Electronic
pubmed:volume
110
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
359-65
pubmed:year
2010
pubmed:articleTitle
A method for correcting the effect of specimen drift on coherent diffractive imaging.
pubmed:affiliation
School of Physics, University of Melbourne, Victoria 3010, Australia.
pubmed:publicationType
Journal Article, Research Support, Non-U.S. Gov't