Source:http://linkedlifedata.com/resource/pubmed/id/19567960
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Predicate | Object |
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rdf:type | |
lifeskim:mentions | |
pubmed:issue |
29
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pubmed:dateCreated |
2009-7-1
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pubmed:abstractText |
We present numerical simulations of gate-all-around (GAA) 3C-SiC and Si nanowire (NW) field effect transistors (FETs) using a full quantum self-consistent Poisson-Schrödinger algorithm within the non-equilibrium Green's function (NEGF) formalism. A direct comparison between Si and 3C-SiC device performances sheds some light on the different transport properties of the two materials. Effective mobility extraction has been performed in a linear transport regime and both phonon- (PH) and surface-roughness-(SR) limited mobility values were computed. 3C-SiC FETs present stronger acoustic phonon scattering, due to a larger deformation potential, resulting in lower phonon-limited mobility values. Although Si NW devices reveal a slightly better electrostatic control compared to 3C-SiC ones, SR-limited mobility shows a slower degradation with increasing charge density for 3C-SiC devices. This implies that the difference between Si and 3C-SiC device mobility is reduced at large gate voltages. 3C-SiC nanowires, besides their advantages compared to silicon ones, present electrical transport properties that are comparable to the Si case.
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pubmed:language |
eng
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pubmed:journal | |
pubmed:status |
PubMed-not-MEDLINE
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pubmed:month |
Jul
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pubmed:issn |
1361-6528
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pubmed:author | |
pubmed:issnType |
Electronic
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pubmed:day |
22
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pubmed:volume |
20
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pubmed:owner |
NLM
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pubmed:authorsComplete |
Y
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pubmed:pagination |
295202
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pubmed:year |
2009
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pubmed:articleTitle |
Phonon- and surface-roughness-limited mobility of gate-all-around 3C-SiC and Si nanowire FETs.
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pubmed:affiliation |
IMEP-LAHC/INP Grenoble, MINATEC, 3 parvis Louis Néel, BP 257, F-38016 Grenoble, France. rogdakik@minatec.inpg.fr
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pubmed:publicationType |
Journal Article,
Research Support, Non-U.S. Gov't
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