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| Predicate | Object |
|---|---|
| rdf:type | |
| lifeskim:mentions | |
| pubmed:issue |
18
|
| pubmed:dateCreated |
1993-12-1
|
| pubmed:abstractText |
Parallel-detection electron energy loss spectroscopy (EELS) combined with scanning transmission electron microscopy (STEM) and a field emission source provides an unprecedented sensitivity for elemental microanalysis. By deflecting the energy loss spectrum across a parallel detector and computing the difference spectrum from sequentially collected energy-shifted spectra, the effects due to detector pattern noise are nearly eliminated so that signals less than 0.1% of the background can be readily detected. Measurements on a series of glass standard reference materials show that EELS provides both high spatial resolution and trace sensitivity at the 10 atomic ppm level for a wide range of elements including the alkaline earths, 3-d transition metals, and the lanthanides. For analytical volumes with dimensions of the order of 10 nm, this translates into near-single atom detectability.
|
| pubmed:language |
eng
|
| pubmed:journal | |
| pubmed:citationSubset |
IM
|
| pubmed:chemical | |
| pubmed:status |
MEDLINE
|
| pubmed:month |
Sep
|
| pubmed:issn |
0003-2700
|
| pubmed:author | |
| pubmed:issnType |
Print
|
| pubmed:day |
15
|
| pubmed:volume |
65
|
| pubmed:owner |
NLM
|
| pubmed:authorsComplete |
Y
|
| pubmed:pagination |
2409-14
|
| pubmed:dateRevised |
2000-12-18
|
| pubmed:meshHeading | |
| pubmed:year |
1993
|
| pubmed:articleTitle |
Trace elemental analysis at nanometer spatial resolution by parallel-detection electron energy loss spectroscopy.
|
| pubmed:affiliation |
Biomedical Engineering and Instrumentation Program, NCRR, National Institutes of Health, Bethesda, Maryland 20892.
|
| pubmed:publicationType |
Journal Article
|