Source:http://linkedlifedata.com/resource/pubmed/id/21231322
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Predicate | Object |
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rdf:type | |
lifeskim:mentions | |
pubmed:issue |
21
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pubmed:dateCreated |
2011-1-14
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pubmed:abstractText |
High-resolution noncontact atomic force microscopy of SiO2 reveals previously unresolved roughness at the few-nm length scale, and scanning tunneling microscopy of graphene on SiO2 shows graphene to be slightly smoother than the supporting SiO2 substrate. A quantitative energetic analysis explains the observed roughness of graphene on SiO2 as extrinsic, and a natural result of highly conformal adhesion. Graphene conforms to the substrate down to the smallest features with nearly 99% fidelity, indicating conformal adhesion can be highly effective for strain engineering of graphene.
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pubmed:language |
eng
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pubmed:journal | |
pubmed:status |
PubMed-not-MEDLINE
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pubmed:month |
Nov
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pubmed:issn |
1079-7114
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pubmed:author | |
pubmed:issnType |
Electronic
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pubmed:day |
19
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pubmed:volume |
105
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pubmed:owner |
NLM
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pubmed:authorsComplete |
Y
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pubmed:pagination |
215504
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pubmed:year |
2010
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pubmed:articleTitle |
High-fidelity conformation of graphene to SiO2 topographic features.
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pubmed:affiliation |
Materials Research Science and Engineering Center, Department of Physics, University of Maryland, College Park, Maryland 20742-4111, USA.
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pubmed:publicationType |
Journal Article
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