Source:http://linkedlifedata.com/resource/pubmed/id/21133077
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rdf:type | |
lifeskim:mentions | |
pubmed:issue |
9
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pubmed:dateCreated |
2010-12-7
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pubmed:abstractText |
Crystalline core/shell Si/SiO2 nanotubes (NTs) with outer diameters of 130-220 nm and lengths of approximately 1 microm have been synthesized using thermal evaporation. High resolution scanning electron microscopy reveals that the NT formation stems from the intrinsic interfacial stress imbalance in the strained Si/SiO2 bilayered film, consequently leading to NTs with different orifice levels. The NT diameters depend strongly on the bilayer film thicknesses and crystal orientations of the Si and SiO2 layers. A modified Timoshenko formula is derived to calculate the dependence of the tube diameter on the bilayer film thickness. The obtained results are consistent well with experimental data.
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pubmed:language |
eng
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pubmed:journal | |
pubmed:status |
PubMed-not-MEDLINE
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pubmed:month |
Sep
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pubmed:issn |
1533-4880
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pubmed:author | |
pubmed:issnType |
Print
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pubmed:volume |
10
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pubmed:owner |
NLM
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pubmed:authorsComplete |
Y
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pubmed:pagination |
5583-6
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pubmed:year |
2010
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pubmed:articleTitle |
Crystalline core/shell Si/SiO2 nanotubes formed via interfacial stress imbalance.
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pubmed:affiliation |
Nanjing National Laboratory of Microstructures and Department of Physics, Nanjing University, Nanjing 210093, PR China.
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pubmed:publicationType |
Journal Article
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