Source:http://linkedlifedata.com/resource/pubmed/id/20049004
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| Predicate | Object |
|---|---|
| rdf:type | |
| lifeskim:mentions | |
| pubmed:issue |
6
|
| pubmed:dateCreated |
2010-1-5
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| pubmed:abstractText |
The controlled removal of material from the surface of insulators has been observed by using a positive ion beam. In the energy range 0.5-2.0 MeV the sputtering yield was observed to be unity. The application of this technique to the manufacture of high quality optical surfaces is discussed.
|
| pubmed:language |
eng
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| pubmed:journal | |
| pubmed:status |
PubMed-not-MEDLINE
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| pubmed:month |
Jun
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| pubmed:issn |
0003-6935
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| pubmed:author | |
| pubmed:issnType |
Print
|
| pubmed:day |
1
|
| pubmed:volume |
5
|
| pubmed:owner |
NLM
|
| pubmed:authorsComplete |
Y
|
| pubmed:pagination |
1031-4
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| pubmed:year |
1966
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| pubmed:articleTitle |
Ionic polishing of optical surfaces.
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| pubmed:affiliation |
Research Department, The Perkin-Elmer Corporation, Norwalk, Connecticut, USA.
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| pubmed:publicationType |
Journal Article
|