Linked Life Data

19830944

Source:http://linkedlifedata.com/resource/pubmed/id/19830944

Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
6
pubmed:dateCreated
2009-10-16
pubmed:abstractText
A Nion spherical-aberration (Cs) corrector was recently installed on Lehigh University's 300-keV cold field-emission gun (FEG) Vacuum Generators HB 603 dedicated scanning transmission electron microscope (STEM), optimized for X-ray analysis of thin specimens. In this article, the impact of the Cs-corrector on X-ray analysis is theoretically evaluated, in terms of expected improvements in spatial resolution and analytical sensitivity, and the calculations are compared with initial experimental results. Finally, the possibilities of atomic-column X-ray analysis in a Cs-corrected STEM are discussed.
pubmed:language
eng
pubmed:journal
pubmed:status
PubMed-not-MEDLINE
pubmed:month
Dec
pubmed:issn
1431-9276
pubmed:author
pubmed:issnType
Print
pubmed:volume
12
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
515-26
pubmed:year
2006
pubmed:articleTitle
Improvements in the X-ray analytical capabilities of a scanning transmission electron microscope by spherical-aberration correction.
pubmed:affiliation
Department of Materials Science and Engineering/Center for Advanced Materials and Nanotechnology, Lehigh University, Bethlehem, PA 18015, USA. masashi.watanabe@lehigh.edu
pubmed:publicationType
Journal Article, Research Support, U.S. Gov't, Non-P.H.S., Research Support, Non-U.S. Gov't