Source:http://linkedlifedata.com/resource/pubmed/id/19392502
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| Predicate | Object |
|---|---|
| rdf:type | |
| lifeskim:mentions | |
| pubmed:issue |
9
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| pubmed:dateCreated |
2009-4-27
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| pubmed:abstractText |
We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.
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| pubmed:commentsCorrections | |
| pubmed:language |
eng
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| pubmed:journal | |
| pubmed:status |
PubMed-not-MEDLINE
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| pubmed:month |
Mar
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| pubmed:issn |
0031-9007
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| pubmed:author | |
| pubmed:issnType |
Print
|
| pubmed:day |
6
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| pubmed:volume |
102
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| pubmed:owner |
NLM
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| pubmed:authorsComplete |
Y
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| pubmed:pagination |
090502
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| pubmed:dateRevised |
2009-5-18
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| pubmed:year |
2009
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| pubmed:articleTitle |
Randomized benchmarking and process tomography for gate errors in a solid-state qubit.
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| pubmed:affiliation |
Department of Physics, Yale University, New Haven, Connecticut 06520, USA.
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| pubmed:publicationType |
Journal Article
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