18657906

Source:http://linkedlifedata.com/resource/pubmed/id/18657906

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Predicate	Object
rdf:type	pubmed:Citation
lifeskim:mentions	umls-concept:C0040975, umls-concept:C0242485, umls-concept:C0262880, umls-concept:C0276640, umls-concept:C0370003, umls-concept:C0597205, umls-concept:C0678118, umls-concept:C0680730, umls-concept:C1148554, umls-concept:C1280412, umls-concept:C1540034
pubmed:issue	12
pubmed:dateCreated	2008-10-20
pubmed:abstractText	A non-destructive method for measuring the thickness of thin amorphous films composed of light elements has been developed. The method employs the statistics of the phase of the electron exit wave function. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential.
pubmed:language	eng
pubmed:journal	http://linkedlifedata.com/resource/pubmed/journal/7513702
pubmed:status	PubMed-not-MEDLINE
pubmed:month	Nov
pubmed:issn	0304-3991
pubmed:author	pubmed-author:CroitoruM DMD, pubmed-author:LiuY ZYZ, pubmed-author:Van DyckDD, pubmed-author:ZhangZZ
pubmed:issnType	Print
pubmed:volume	108
pubmed:owner	NLM
pubmed:authorsComplete	Y
pubmed:pagination	1616-22
pubmed:year	2008
pubmed:articleTitle	Measurement of specimen thickness by phase change determination in TEM.
pubmed:affiliation	University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium. mihail.croitoru@ua.ac.be
pubmed:publicationType	Journal Article