Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
5887
pubmed:dateCreated
2008-7-18
pubmed:abstractText
Coherent diffractive imaging (CDI) and scanning transmission x-ray microscopy (STXM) are two popular microscopy techniques that have evolved quite independently. CDI promises to reach resolutions below 10 nanometers, but the reconstruction procedures put stringent requirements on data quality and sample preparation. In contrast, STXM features straightforward data analysis, but its resolution is limited by the spot size on the specimen. We demonstrate a ptychographic imaging method that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan. The high penetration power of x-rays in combination with the high spatial resolution will allow investigation of a wide range of complex mesoscopic life and material science specimens, such as embedded semiconductor devices or cellular networks.
pubmed:commentsCorrections
pubmed:language
eng
pubmed:journal
pubmed:citationSubset
IM
pubmed:status
MEDLINE
pubmed:month
Jul
pubmed:issn
1095-9203
pubmed:author
pubmed:issnType
Electronic
pubmed:day
18
pubmed:volume
321
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
379-82
pubmed:dateRevised
2008-9-25
pubmed:meshHeading
pubmed:year
2008
pubmed:articleTitle
High-resolution scanning x-ray diffraction microscopy.
pubmed:affiliation
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. pierre.thibault@psi.ch
pubmed:publicationType
Journal Article, Research Support, Non-U.S. Gov't