Linked Life Data

17975597

Source:http://linkedlifedata.com/resource/pubmed/id/17975597

Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
21
pubmed:dateCreated
2007-11-2
pubmed:abstractText
We investigated experimentally the evanescent field enhancement based on dielectric thin films in total internal reflection microscopy. The sample employed two layers of Al2O3 and SiO2 deposited on an SF10 glass substrate. Field intensity enhancement measured by fluorescent excitation of microbeads relative to that of a control sample without dielectric films was polarization dependent, determined as 4.2 and 2.4 for TE and TM polarizations, respectively, and was in good agreement with numerical results. The thin-film-based field enhancement was also applied to live-cell imaging of quantum dots, which confirmed the sensitivity enhancement qualitatively.
pubmed:language
eng
pubmed:journal
pubmed:citationSubset
IM
pubmed:chemical
pubmed:status
MEDLINE
pubmed:month
Nov
pubmed:issn
0146-9592
pubmed:author
pubmed:issnType
Print
pubmed:day
1
pubmed:volume
32
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
3062-4
pubmed:meshHeading
pubmed:year
2007
pubmed:articleTitle
Thin-film-based sensitivity enhancement for total internal reflection fluorescence live-cell imaging.
pubmed:affiliation
Program for Nanomedical Science and Technology, Department of Medical Imaging, School of Medicine, Yonsei University, Seoul, Korea.
pubmed:publicationType
Journal Article, Research Support, Non-U.S. Gov't