Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
11
pubmed:dateCreated
2007-11-2
pubmed:abstractText
A theoretical and numerical analysis of spectral self-interference microscopy (SSM) is presented with the goal of expanding the realm of SSM applications. In particular, this work is intended to enable SSM imaging in low-signal applications such as single-molecule studies. A comprehensive electromagnetic model for SSM is presented, allowing arbitrary forms of the excitation field, detection optics, and tensor sample response. An evanescently excited SSM system, analogous to total internal reflection microscopy, is proposed and investigated through Monte Carlo simulations. Nanometer-scale axial localization for single-emitter objects is demonstrated, even in low-signal environments. The capabilities of SSM in imaging more general objects are also considered--specifically, imaging arbitrary fluorophore distributions and two-emitter objects. A data-processing method is presented that makes SSM robust to noise and uncertainties in the detected spectral envelope.
pubmed:grant
pubmed:language
eng
pubmed:journal
pubmed:citationSubset
IM
pubmed:chemical
pubmed:status
MEDLINE
pubmed:month
Nov
pubmed:issn
1084-7529
pubmed:author
pubmed:issnType
Print
pubmed:volume
24
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
3587-99
pubmed:meshHeading
pubmed:year
2007
pubmed:articleTitle
Spectral self-interference microscopy for low-signal nanoscale axial imaging.
pubmed:affiliation
Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 405 North Mathews Avenue, Urbana, Illinois 61801, USA. bryn@uiuc.edu
pubmed:publicationType
Journal Article, Research Support, U.S. Gov't, Non-P.H.S., Research Support, N.I.H., Extramural