Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
3
pubmed:dateCreated
2006-12-28
pubmed:abstractText
We demonstrate experimentally the power of a novel analytical tool for X-ray spectromicroscopy. This provides a minimally intrusive elemental mapping of surfaces at the nanoscale and holds the promise of remarkable versatility. We have applied our procedure to the characterization of Ge(Si) islands on Si(111) substrates, with the aim of investigating the surface stoichiometry gradients and gaining insight into the intermixing dynamics. By identifying Si-richer edges with respect to the centers, we are able to associate alloying in these islands to surface transport processes.
pubmed:language
eng
pubmed:journal
pubmed:citationSubset
IM
pubmed:status
MEDLINE
pubmed:month
Mar
pubmed:issn
1613-6829
pubmed:author
pubmed:issnType
Electronic
pubmed:volume
2
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
401-5
pubmed:dateRevised
2008-4-17
pubmed:meshHeading
pubmed:year
2006
pubmed:articleTitle
Chemical mapping of individual semiconductor nanostructures.
pubmed:affiliation
INRS Energie, Matériaux et Télécommunications, Université du Québec, 1650 Boul. Lionel Boulet, J3X 1S2 Varennes, QC, Canada.
pubmed:publicationType
Journal Article, Research Support, Non-U.S. Gov't