Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
11-12
pubmed:dateCreated
2006-10-9
pubmed:abstractText
Electron tomography is a powerful technique that can probe the three-dimensional (3-D) structure of materials. Recently, this technique has been successfully applied to inorganic materials using Z-contrast imaging in a scanning transmission electron microscope to image nanomaterials in 3-D with a resolution of 1 nm in all three spatial dimensions. However, an artifact intrinsic to this technique limits the amount of information obtainable from any object, namely the missing wedge. One way to circumvent this problem is to acquire data from two perpendicular tilt axes, a technique called "dual axis tomography." This paper presents the first dual axis data at high resolution for inorganic materials, and by studying a CdTe tetrapod sample, demonstrates the increase in information obtained using this technique.
pubmed:language
eng
pubmed:journal
pubmed:status
PubMed-not-MEDLINE
pubmed:issn
0304-3991
pubmed:author
pubmed:issnType
Print
pubmed:volume
106
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
994-1000
pubmed:articleTitle
Reducing the missing wedge: High-resolution dual axis tomography of inorganic materials.
pubmed:affiliation
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK. iarslan@sandia.gov
pubmed:publicationType
Journal Article, Research Support, Non-U.S. Gov't