Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
11
pubmed:dateCreated
2006-1-5
pubmed:abstractText
The use of stiff cantilevers with diamond tips allows us to perform nanoindentations on hard covalent materials such as silicon with atomic force microscopy. Thanks to the high sensitivity in the force measurements together with the high resolution upon imaging the surface, we can study nanomechanical properties. At this scale, the surface deforms, following a simple non-Hertzian spring model. The plastic onset can be assessed from a discontinuity in the force-distance curves. Hardness measurements with penetration depths as small as 1 nm yield H= approximately 25 GPa, thus showing a drastic increase with penetration depths below 5 nm.
pubmed:language
eng
pubmed:journal
pubmed:citationSubset
IM
pubmed:chemical
pubmed:status
MEDLINE
pubmed:month
Sep
pubmed:issn
0021-9606
pubmed:author
pubmed:issnType
Print
pubmed:day
15
pubmed:volume
123
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
114711
pubmed:meshHeading
pubmed:year
2005
pubmed:articleTitle
Nanomechanics of silicon surfaces with atomic force microscopy: an insight to the first stages of plastic deformation.
pubmed:affiliation
Center for Bioengineering of Catalonia (CREBEC) and Department of Physical Chemistry, University of Barcelona, Spain.
pubmed:publicationType
Journal Article, Research Support, Non-U.S. Gov't