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PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
Pt 5
pubmed:dateCreated
2005-8-25
pubmed:abstractText
Polychromatic single-crystal diffraction (pSXD) offers important advantages compared with monochromatic diffraction, such as ultrafast data collection and the ability to collect diffraction data without sample rotation. Despite the relevance of these advantages for applications in high-pressure experiments, pSXD has never been successfully applied for full structure determination at high pressure. Here the theory of polychromatic microdiffraction, strategies developed to adapt it to high-pressure applications, and results of pilot experiments are described. Special emphasis is placed on experiments with microcrystals and multigrain aggregates, and on the use of monochromator scans to extend the pressure range for single-crystal structure determination to the megabar region. Closely related applications to materials research problems are also discussed.
pubmed:language
eng
pubmed:journal
pubmed:status
PubMed-not-MEDLINE
pubmed:month
Sep
pubmed:issn
0909-0495
pubmed:author
pubmed:issnType
Print
pubmed:volume
12
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
608-17
pubmed:year
2005
pubmed:articleTitle
Adapting polychromatic X-ray microdiffraction techniques to high-pressure research: energy scan approach.
pubmed:affiliation
Oak Ridge National Laboratory, PO BOX 2008 MS6118, Oak Ridge, TN 37831-6118, USA.
pubmed:publicationType
Journal Article