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PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
7
pubmed:dateCreated
2005-7-20
pubmed:abstractText
Individual noble-metal particles, with sizes ranging from a few tenths to some hundreds of nanometers, can now be detected by far-field optics. Single-particle microscopy gives access to inhomogeneity, distributions, and fluctuations, which were previously hidden in ensemble experiments. Scattering methods rely on dark-field illumination, spectral signatures of the metal particles, or both. More advanced techniques provide high sensitivity and improved selectivity with respect to other scatterers by isolating metal-specific signals, for example the refractive index change due to heating of the environment by a pump beam or the time-resolved optical response of the particle to a short pump pulse. We review and compare linear and nonlinear methods in far-field optical microscopy that have reached the single-particle regime by means of scattered light, thermal effects, photoluminescence, or nonlinear frequency generation.
pubmed:language
eng
pubmed:journal
pubmed:status
PubMed-not-MEDLINE
pubmed:month
Jul
pubmed:issn
0001-4842
pubmed:author
pubmed:issnType
Print
pubmed:volume
38
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
594-601
pubmed:year
2005
pubmed:articleTitle
Far-field optical microscopy of single metal nanoparticles.
pubmed:affiliation
MoNOS, Huygens Laboratory, Universiteit Leiden, P.O. Box 9504, 2300 RA Leiden, The Netherlands.
pubmed:publicationType
Journal Article