Source:http://linkedlifedata.com/resource/pubmed/id/15556695
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Predicate | Object |
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rdf:type | |
lifeskim:mentions | |
pubmed:issue |
1
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pubmed:dateCreated |
2004-11-23
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pubmed:abstractText |
We present a numerical method to model electric-field-sensitive scanning probe microscopy measurements which allows for a tip of arbitrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.
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pubmed:language |
eng
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pubmed:journal | |
pubmed:citationSubset |
IM
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pubmed:chemical | |
pubmed:status |
MEDLINE
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pubmed:month |
Dec
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pubmed:issn |
0304-3991
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pubmed:author | |
pubmed:issnType |
Print
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pubmed:volume |
102
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pubmed:owner |
NLM
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pubmed:authorsComplete |
Y
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pubmed:pagination |
7-12
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pubmed:dateRevised |
2006-11-15
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pubmed:meshHeading | |
pubmed:year |
2004
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pubmed:articleTitle |
Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shape.
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pubmed:affiliation |
Department of Physics and Astronomy, Michigan State University, 4237 Biomedical Physical Sciences, East Lansing, MI 48824-2320, USA.
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pubmed:publicationType |
Journal Article,
Comparative Study,
Research Support, U.S. Gov't, Non-P.H.S.,
Research Support, Non-U.S. Gov't
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