Source:http://linkedlifedata.com/resource/pubmed/id/15450661
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Predicate | Object |
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rdf:type | |
lifeskim:mentions | |
pubmed:issue |
2-4
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pubmed:dateCreated |
2004-9-28
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pubmed:abstractText |
In this work, an atomic force microscope (AFM) with an integrated thermal sensor has been used to obtain the local spatial distribution of temperatures in a micromachined thermopile with submicron resolution. In this communication, we will show how the dimensional, structural and functional characteristics of a thermopile suits well with the requirements for AFM thermal imaging, and how a deeper insight of the thermopile operation can be gained with the aid of these advanced scanning probe-based tools.
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pubmed:language |
eng
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pubmed:journal | |
pubmed:citationSubset |
IM
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pubmed:chemical | |
pubmed:status |
MEDLINE
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pubmed:month |
Nov
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pubmed:issn |
0304-3991
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pubmed:author | |
pubmed:issnType |
Print
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pubmed:volume |
101
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pubmed:owner |
NLM
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pubmed:authorsComplete |
Y
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pubmed:pagination |
153-9
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pubmed:dateRevised |
2006-11-15
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pubmed:meshHeading | |
pubmed:year |
2004
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pubmed:articleTitle |
Thermal AFM: a thermopile case study.
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pubmed:affiliation |
Centro Nacional de Microelectrónica (IMB-CSIC) Campus Universidad Autonoma de Barcelona, 08193 Bellaterra, Spain. luis.fonseca@cnm.es
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pubmed:publicationType |
Journal Article,
Research Support, Non-U.S. Gov't
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