Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
6
pubmed:dateCreated
2003-8-26
pubmed:abstractText
The structure of Na2Si2O5 from room temperature up to 1,773 K are studied by high temperature Raman spectroscopy using copper vapor pulse laser and integral time-resolved detection technique without any black-body radiation effect on spectral record. Back-scattering optical configuration is coupled with confocal collection of Raman signal of macro-sample in the high temperature shaft tube furnace. Results show that temperature-dependent Raman spectra can clearly indicate phase transition during melting. Relative densities of various kinds of SiO4(n-4) (n, bridging-oxygen number binding to one tetrahedron former Si) tetrahedrons can be qualitatively and quantitatively resolved by Gaussian spectral deconvolution. Obviously high temperature Raman spectroscopy provides an useful tool for the micro-structure research of materials under high temperature.
pubmed:language
chi
pubmed:journal
pubmed:citationSubset
IM
pubmed:chemical
pubmed:status
MEDLINE
pubmed:month
Dec
pubmed:issn
1000-0593
pubmed:author
pubmed:issnType
Print
pubmed:volume
20
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
797-9
pubmed:dateRevised
2006-11-15
pubmed:meshHeading
pubmed:year
2000
pubmed:articleTitle
[High temperature Raman spectroscopic study of the structure of sodium disilicate crystal, glass and its melt].
pubmed:affiliation
Shanghai University, Shanghai Enhanced Laboratory of Ferrometallurgy, 200072 Shanghai.
pubmed:publicationType
Journal Article, English Abstract, Research Support, Non-U.S. Gov't