Linked Life Data

12871814

Source:http://linkedlifedata.com/resource/pubmed/id/12871814

Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
3-4
pubmed:dateCreated
2003-7-21
pubmed:abstractText
New experiments made possible with a commercial transmission electron microscope (TEM) equipped with a high-resolution electron energy loss spectrometer (EELS) are presented. With this commercial system, a 100 meV energy resolution using a sub 2 nm probe or 500 meV at a 0.20 nm probe are possible, in combination with other modern techniques available for TEMs. In this paper a number of explorative examples of the first results are shown. The benefit of the increased resolution for detecting more details in near edge structures are shown for the Ti K edge in TiO(2) (brookite) and for the N K edge in cubic and hexagonal GaN. The bandgap of GaN is studied in both crystal structures, as well as the dependency of the low-loss spectrum on the momentum transfer direction in diffraction mode.
pubmed:language
eng
pubmed:journal
pubmed:status
PubMed-not-MEDLINE
pubmed:month
Sep
pubmed:issn
0304-3991
pubmed:author
pubmed:issnType
Print
pubmed:volume
96
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
535-46
pubmed:year
2003
pubmed:articleTitle
Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy.
pubmed:affiliation
National Centre for HREM, Department of Technical Sciences, Delft University of Technology, Laboratory for Materials Science, Rotterdamseweg 137, Delft 2628 AL, The Netherlands.
pubmed:publicationType
Journal Article