Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
Pt 3
pubmed:dateCreated
2003-3-18
pubmed:abstractText
A combined system for far- and near-field optical spectroscopy consisting of a compact scanning near-field optical microscope and a dedicated spectrometer was realized. The set-up allows the optical investigation of samples at temperatures from 10 to 300 K. The sample positioning range is as large as 5 x 5 x 5 mm3 and the spatial resolution is in the range of 1.5 micro m in the far-field optical microscopy mode at low temperatures. In the scanning near-field optical microscope mode the resolution is defined by the microfabricated cantilever probe, which is placed in the focus of a double-mirror objective. The tip-to-sample distance in the scanning near-field optical microscope is controlled by a beam deflection system in dynamic scanning force microscopy mode. After a description of the apparatus, scanning force topography images of self-assembled InAs quantum dots on a GaAs substrate with a density of less than one dot per square micrometre are shown, followed by the first spectroscopic investigations of such a sample. The presented results demonstrate the potential of the system.
pubmed:language
eng
pubmed:journal
pubmed:citationSubset
IM
pubmed:chemical
pubmed:status
MEDLINE
pubmed:month
Mar
pubmed:issn
0022-2720
pubmed:author
pubmed:issnType
Print
pubmed:volume
209
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
199-204
pubmed:dateRevised
2008-11-21
pubmed:meshHeading
pubmed:year
2003
pubmed:articleTitle
Low-temperature scanning system for near- and far-field optical investigations.
pubmed:affiliation
Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany.
pubmed:publicationType
Journal Article, Research Support, Non-U.S. Gov't