Statements in which the resource exists as a subject.
PredicateObject
rdf:type
lifeskim:mentions
pubmed:issue
1-4
pubmed:dateCreated
2002-10-17
pubmed:abstractText
The track formation in solid state materials, from the theoretical point of view, is still under study. One way to understand the track formation mechanisms and radiation damage of the charged particles in some materials such as polymers, glasses and minerals, is to analyse the surface topography effects. In this work, the track formation analysis in polycarbonate material is presented using an atomic force microscope (AFM) to characterise the evolution of the track on the material surface and beyond a thin layer of the surface material. The AFM is very useful to obtain valuable information at the level of the atomic structure of the materials and of the nuclear tracks, due to its high resolution and very easy operation involving also a simple sample preparation. The results show the development of the formed track by means of induced surface effects after being exposed to ionising radiation and chemical etching.
pubmed:language
eng
pubmed:journal
pubmed:citationSubset
IM
pubmed:status
MEDLINE
pubmed:issn
0144-8420
pubmed:author
pubmed:issnType
Print
pubmed:volume
101
pubmed:owner
NLM
pubmed:authorsComplete
Y
pubmed:pagination
89-92
pubmed:dateRevised
2006-11-15
pubmed:meshHeading
pubmed:year
2002
pubmed:articleTitle
Analysis of the formed track in solid state materials using atomic force microscopy.
pubmed:affiliation
Instituto de Fisica, UNAM, México, DF. espinosa@fisica.unam.mx
pubmed:publicationType
Journal Article, Research Support, Non-U.S. Gov't