| umls-concept:C0678118 | skos:definition | CSP: original electron microscopic technique; the photographic imaging of a sample created by a beam of electrons passing through a thin section; resolution ranges from macromolecular to cellular.,NCI: An electron microscopy imaging technique that is utilized to examine structural components of a sample by passing electrons through the specimen.,MSH: Electron microscopy in which the ELECTRONS or their reaction products that pass down through the specimen are imaged below the plane of the specimen.,NCI: An electron microscopy imaging technique that is utilized to examine structural components of a sample by passing electrons through the specimen.,HL7V3.0: <p>Microscopy, Transmission electron</p> | lld:umls |
