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pubmed-article:18269259pubmed:abstractTextOne of the central challenges of nanoscience is fabrication of nanoscale structures with well-controlled architectures using planar thin-film technology. Herein, we report that ordered nanocheckerboards in ZnMnGaO4 films were grown epitaxially on single-crystal MgO substrates by utilizing a solid-state method of the phase separation-induced self-assembly. The films consist of two types of chemically distinct and regularly spaced nanorods with mutually coherent interfaces, approximately 4 x 4 x 750 nm3 in size and perfectly aligned along the film growth direction. Surprisingly, a significant in-plane strain, more than 2%, from the substrate is globally maintained over the entire film thickness of about 820 nm. The strain energy from Jahn-Teller distortions and the film-substrate lattice mismatch induce the coherent three-dimensional (3D) self-assembled nanostructure, relieving the volume strain energy while suppressing the formation of dislocations.lld:pubmed
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pubmed-article:18269259pubmed:year2008lld:pubmed
pubmed-article:18269259pubmed:articleTitleHighly aligned epitaxial nanorods with a checkerboard pattern in oxide films.lld:pubmed
pubmed-article:18269259pubmed:affiliationRutgers Center for Emergent Materials, Rutgers University, Piscataway, New Jersey 08854, USA. floura@physics.rutgers.edulld:pubmed
pubmed-article:18269259pubmed:publicationTypeJournal Articlelld:pubmed
pubmed-article:18269259pubmed:publicationTypeResearch Support, U.S. Gov't, Non-P.H.S.lld:pubmed
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