| pubmed-article:17608167 | pubmed:abstractText | The temporal behaviors of free photoelectrons and shallow-trapped electrons were measured in the cubic AgCl emulsion with the microwave absorption and dielectric spectrum detection technique. The results indicate that the chemical sensitization makes the photoelectron decay slower than that of the unsensitized AgCl emulsion, and the decay time is prolonged in the sulfur-plus-gold sensitized emulsion, because the shallow electron trap effect of sulfur-plus-gold sensitization center restrains the recombination of photoelectron and hole. The photoelectron decay is pricked up and the decay time is shorter in sensitized emulsion than that in the unsensitized AgCl emulsion, because the J-aggregates increase the interstice silver ion density in the AgCl microcrystal and accelerate the recombination of interstice silver ions and electrons. The decay time of photoelectron in chemistry-and-spectra sensitized emulsion is also prolonged, and the shallow electron trap effect of chemical sensitization center is more distinct under the condition of spectra sensitization. | lld:pubmed |
