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pubmed-article:16834408pubmed:issue7lld:pubmed
pubmed-article:16834408pubmed:dateCreated2006-7-12lld:pubmed
pubmed-article:16834408pubmed:abstractTextUltrafast relaxation dynamics of charge carriers in CdSe quantum wires with diameters between 6 and 8 nm are studied as a function of carrier density. At high electron-hole pair densities above 10(19) cm(-3) the dominant process for carrier cooling is the "bimolecular" Auger recombination of one-dimensional (1D) excitons. However, below this excitation level an unexpected transition from a bimolecular (exciton-exciton) to a three-carrier Auger relaxation mechanism occurs. Thus, depending on excitation intensity, electron-hole pair relaxation dynamics in the nanowires exhibit either 1D or 0D (quantum dot) character. This dual nature of the recovery kinetics defines an optimal intensity for achieving optical gain in solution-grown nanowires given the different carrier-density-dependent scaling of relaxation rates in either regime.lld:pubmed
pubmed-article:16834408pubmed:languageenglld:pubmed
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pubmed-article:16834408pubmed:statusMEDLINElld:pubmed
pubmed-article:16834408pubmed:monthJullld:pubmed
pubmed-article:16834408pubmed:issn1530-6984lld:pubmed
pubmed-article:16834408pubmed:authorpubmed-author:KamatPrashant...lld:pubmed
pubmed-article:16834408pubmed:authorpubmed-author:BunkerBruce...lld:pubmed
pubmed-article:16834408pubmed:authorpubmed-author:RobelIstvánIlld:pubmed
pubmed-article:16834408pubmed:authorpubmed-author:KunoMasaruMlld:pubmed
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pubmed-article:16834408pubmed:volume6lld:pubmed
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pubmed-article:16834408pubmed:pagination1344-9lld:pubmed
pubmed-article:16834408pubmed:dateRevised2006-11-15lld:pubmed
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pubmed-article:16834408pubmed:year2006lld:pubmed
pubmed-article:16834408pubmed:articleTitleExciton recombination dynamics in CdSe nanowires: bimolecular to three-carrier Auger kinetics.lld:pubmed
pubmed-article:16834408pubmed:affiliationRadiation Laboratory, University of Notre Dame, Indiana 46556, USA.lld:pubmed
pubmed-article:16834408pubmed:publicationTypeJournal Articlelld:pubmed
pubmed-article:16834408pubmed:publicationTypeResearch Support, U.S. Gov't, Non-P.H.S.lld:pubmed
pubmed-article:16834408pubmed:publicationTypeResearch Support, Non-U.S. Gov'tlld:pubmed