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pubmed-article:15246400pubmed:dateCreated2004-7-12lld:pubmed
pubmed-article:15246400pubmed:abstractTextA first test for neutron detection with a flat panel device based on the amorphous silicon technology is described in this report. The most important parameters defining the performance for neutron imaging are described. The first findings are encouraging for further improvements.lld:pubmed
pubmed-article:15246400pubmed:languageenglld:pubmed
pubmed-article:15246400pubmed:journalhttp://linkedlifedata.com/r...lld:pubmed
pubmed-article:15246400pubmed:statusPubMed-not-MEDLINElld:pubmed
pubmed-article:15246400pubmed:monthOctlld:pubmed
pubmed-article:15246400pubmed:issn0969-8043lld:pubmed
pubmed-article:15246400pubmed:authorpubmed-author:LehmannEElld:pubmed
pubmed-article:15246400pubmed:authorpubmed-author:VontobelPPlld:pubmed
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pubmed-article:15246400pubmed:volume61lld:pubmed
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pubmed-article:15246400pubmed:pagination567-71lld:pubmed
pubmed-article:15246400pubmed:year2004lld:pubmed
pubmed-article:15246400pubmed:articleTitleThe use of amorphous silicon flat panels as detector in neutron imaging.lld:pubmed
pubmed-article:15246400pubmed:affiliationPaul Scherrer Institute, WHGA/349, Villigen PSI CH-5232, Switzerland. eberhard.lehmann@psi.chlld:pubmed
pubmed-article:15246400pubmed:publicationTypeJournal Articlelld:pubmed